Fast fitting of reflectivity data of growing thin films using neural networks

dc.contributor.author	Greco, Alessandro
dc.contributor.author	Starostin, Vladimir
dc.contributor.author	Gerlach, Alexander
dc.contributor.author	Schreiber, Frank
dc.contributor.author	Hinderhofer, Alexander
dc.date.accessioned	2020-07-09T09:19:55Z
dc.date.available	2020-07-09T09:19:55Z
dc.date.issued	2019
dc.identifier.issn	1600-5767
dc.identifier.uri	http://hdl.handle.net/10900/102484
dc.language.iso	en	de_DE
dc.publisher	Int Union Crystallography	de_DE
dc.relation.uri	http://dx.doi.org/10.1107/S1600576719013311	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	570	de_DE
dc.subject.ddc	610	de_DE
dc.title	Fast fitting of reflectivity data of growing thin films using neural networks	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200409032300_00179
utue.publikation.seiten	1342-1347	de_DE
utue.personen.roh	Greco, Alessandro
utue.personen.roh	Starostin, Vladimir
utue.personen.roh	Karapanagiotis, Christos
utue.personen.roh	Hindcrhofer, Alexander
utue.personen.roh	Gerlach, Alexander
utue.personen.roh	Pithan, Linus
utue.personen.roh	Liehr, Sascha
utue.personen.roh	Schreiber, Frank
utue.personen.roh	Kowarik, Stefan
dcterms.isPartOf.ZSTitelID	Journal of Applied Crystallography	de_DE
dcterms.isPartOf.ZS-Volume	52	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE