Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

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dc.contributor.author Kobald, Arne
dc.contributor.author Chen, Yu-Ting
dc.contributor.author Meixner, Alfred J.
dc.contributor.author Zhang, Dai
dc.contributor.author Berg, Marius F.A. van den
dc.contributor.author Horneber, Anke
dc.date.accessioned 2020-11-26T15:51:13Z
dc.date.available 2020-11-26T15:51:13Z
dc.date.issued 2020
dc.identifier.issn 2190-4286
dc.identifier.uri http://hdl.handle.net/10900/109838
dc.language.iso en de_DE
dc.publisher Beilstein - Institut de_DE
dc.relation.uri http://dx.doi.org/10.3762/bjnano.11.99 de_DE
dc.subject.ddc 530 de_DE
dc.subject.ddc 600 de_DE
dc.title Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy de_DE
dc.type Article de_DE
utue.quellen.id 20200929220116_00446
utue.publikation.seiten 1147-1156 de_DE
utue.personen.roh van den Berg, Marius
utue.personen.roh Moeinian, Ardeshir
utue.personen.roh Kobald, Arne
utue.personen.roh Chen, Yu-Ting
utue.personen.roh Horneber, Anke
utue.personen.roh Strehle, Steffen
utue.personen.roh Meixner, Alfred J.
utue.personen.roh Zhang, Dai
dcterms.isPartOf.ZSTitelID Beilstein Journal of Nanotechnology de_DE
dcterms.isPartOf.ZS-Volume 11 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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