Probing Bias-Induced Electron Density Shifts in Metal-Molecule Interfaces via Tip-Enhanced Raman Scattering

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dc.contributor.author Braun, Kai
dc.contributor.author Hauler, Otto
dc.contributor.author Zhang, Dai
dc.contributor.author Chassé, Thomas
dc.contributor.author Meixner, Alfred J.
dc.date.accessioned 2021-08-27T11:10:05Z
dc.date.available 2021-08-27T11:10:05Z
dc.date.issued 2021
dc.identifier.issn 1520-5126
dc.identifier.uri http://hdl.handle.net/10900/118305
dc.language.iso en de_DE
dc.publisher Amer Chemical Soc de_DE
dc.relation.uri http://dx.doi.org/10.1021/jacs.0c09392 de_DE
dc.subject.ddc 540 de_DE
dc.title Probing Bias-Induced Electron Density Shifts in Metal-Molecule Interfaces via Tip-Enhanced Raman Scattering de_DE
dc.type Article de_DE
utue.quellen.id 20210512015105_00886
utue.publikation.seiten 1816-1821 de_DE
utue.personen.roh Braun, Kai
utue.personen.roh Hauler, Otto
utue.personen.roh Zhang, Dai
utue.personen.roh Wang, Xiao
utue.personen.roh Chasse, Thomas
utue.personen.roh Meixner, Alfred J.
dcterms.isPartOf.ZSTitelID Journal of The American Chemical Society de_DE
dcterms.isPartOf.ZS-Issue 4 de_DE
dcterms.isPartOf.ZS-Volume 143 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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