Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations

dc.contributor.author	Hofer, Christoph
dc.contributor.author	Haas, Jonas
dc.contributor.author	Braun, Kai
dc.contributor.author	Pennington, Robert S.
dc.contributor.author	Meyer, Jannik C.
dc.date.accessioned	2021-11-12T11:03:29Z
dc.date.available	2021-11-12T11:03:29Z
dc.date.issued	2021
dc.identifier.issn	1879-2723
dc.identifier.uri	http://hdl.handle.net/10900/120723
dc.language.iso	en	en
dc.publisher	Elsevier	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.ultramic.2021.113292	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	570	de_DE
dc.title	Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210824232002_00135
utue.personen.roh	Hofer, Christoph
utue.personen.roh	Skakalova, Viera
utue.personen.roh	Haas, Jonas
utue.personen.roh	Wang, Xiao
utue.personen.roh	Braun, Kai
utue.personen.roh	Pennington, Robert S.
utue.personen.roh	Meyer, Jannik C.
dcterms.isPartOf.ZSTitelID	Ultramicroscopy	de_DE
dcterms.isPartOf.ZS-Issue	Article 113292	de_DE
dcterms.isPartOf.ZS-Volume	227	de_DE
utue.fakultaet	04 Medizinische Fakultät	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE