Provably Adversarially Robust Nearest Prototype Classifiers

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Provably Adversarially Robust Nearest Prototype Classifiers

Author: Hein, Matthias; Voráček, Václav
Tübinger Autor(en):
Hein, Matthias
Issue year: 2022-07-14
Verlagsangabe: arXiv
Language: English
Full text: https://doi.org/10.48550/arXiv.2207.07208
DDC Classifikation: 004 - Data processing and computer science
Dokumentart: Preprint
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