Assessing Antisite Defect and Impurity Concentrations in Bi2Te3 Based Thin Films by High-Accuracy Chemical Analysis

dc.contributor.author	Peranio, Nicola
dc.contributor.author	Eibl, Oliver
dc.contributor.author	Dürrschnabel, Michael Thomas
dc.date.accessioned	2014-02-04T09:03:08Z
dc.date.available	2014-02-04T09:03:08Z
dc.date.issued	2013
dc.identifier.issn	1616-301X
dc.identifier.uri	http://hdl.handle.net/10900/40511
dc.language.iso	en	de_DE
dc.publisher	Wiley - V C H Verlag Gmbh	de_DE
dc.relation.uri	http://dx.doi.org/10.1002/adfm.201300606	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	Assessing Antisite Defect and Impurity Concentrations in Bi2Te3 Based Thin Films by High-Accuracy Chemical Analysis	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140116051827_00429	de_DE
utue.publikation.seiten	4969-4976	de_DE
utue.personen.roh	Peranio, Nicola
utue.personen.roh	Winkler, Markus
utue.personen.roh	Duerrschnabel, Michael
utue.personen.roh	Koenig, Jan
utue.personen.roh	Eibl, Oliver
dcterms.isPartOf.ZSTitelID	Advanced Functional Materials	de_DE
dcterms.isPartOf.ZS-Issue	39	de_DE
dcterms.isPartOf.ZS-Volume	23	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE