Low temperature light yield measurements in NaI and NaI(Tl)

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dc.contributor.author Jochum, Josef
dc.contributor.author Strandhagen, Christian
dc.contributor.author Sailer, Christof
dc.date.accessioned 2014-03-17T13:56:53Z
dc.date.available 2014-03-17T13:56:53Z
dc.date.issued 2012
dc.identifier.issn 1434-6044
dc.identifier.uri http://hdl.handle.net/10900/44190
dc.language.iso en de_DE
dc.publisher Springer de_DE
dc.relation.uri http://dx.doi.org/10.1140/epjc/s10052-012-2061-7 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 530 de_DE
dc.title Low temperature light yield measurements in NaI and NaI(Tl) de_DE
dc.type Article de_DE
utue.quellen.id 20140226071329_02076 de_DE
utue.personen.roh Sailer, C.
utue.personen.roh Lubsandorzhiev, B.
utue.personen.roh Strandhagen, C.
utue.personen.roh Jochum, J.
dcterms.isPartOf.ZSTitelID European Physical Journal C de_DE
dcterms.isPartOf.ZS-Issue Article 2061 de_DE
dcterms.isPartOf.ZS-Volume 72 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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