Charge granularity in single electron transistors with polysilicon gates

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Charge granularity in single electron transistors with polysilicon gates

Author: Kotekar-Patil, Dharmraj; Jauerneck, Stefan; Ruoff, Matthias; Wharam, David A.; Kern, Dieter P.; Jehl, X.; Wacquez, R.; Sanquer, M.
Tübinger Autor(en):
Kotekar-Patil, Dharmraj
Jauerneck, Stefan
Ruoff, Matthias
Wharam, David A.
Kern, Dieter P.
Issue year: 2012
Verlagsangabe: New York, NY : IEEE
Language: English
Full text: http://dx.doi.org/10.1109/ULIS.2012.6193364
ISBN: 978-1-4673-0191-6
978-1-4673-0190-9
DDC Classifikation: 530 - Physics
Dokumentart: BookPart
Published in: Proceedings of the 13th International Conference on Ultimate Integration on Silicon (ULIS), 2012
Page range: (89-92)
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