dc.contributor.author | Bringmann, Oliver | |
dc.contributor.author | Rosenstiel, Wolfgang | |
dc.contributor.author | Viehl, Alexander | |
dc.date.accessioned | 2015-04-30T14:36:30Z | |
dc.date.available | 2015-04-30T14:36:30Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 1636-9874 | |
dc.identifier.uri | http://hdl.handle.net/10900/63039 | |
dc.language.iso | en | de_DE |
dc.publisher | IEEE | de_DE |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject.ddc | 004 | de_DE |
dc.title | Advanced Features for Industry-Level Logging and Tracing of C-based Designs | de_DE |
dc.type | Article | de_DE |
dc.type | ConferenceObject | de_DE |
utue.publikation.seiten | 1-6 | de_DE |
utue.personen.roh | Hong, Wei | |
utue.personen.roh | Joshi, Jyoti | |
utue.personen.roh | Viehl, Alexander | |
utue.personen.roh | Bannow, Nico | |
utue.personen.roh | Kramer, Angela | |
utue.personen.roh | Post, Hendrik | |
utue.personen.roh | Bringmann, Oliver | |
utue.personen.roh | Rosenstiel, Wolfgang | |
dcterms.isPartOf.ZSTitelID | Proceedings Forum on Specification and Design Languages FDL 2013 | de_DE |
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