| dc.contributor.author | 
Willsch, Benjamin | 
 | 
| dc.contributor.author | 
Kumar, Praveen | 
 | 
| dc.contributor.author | 
Eibl, Oliver | 
 | 
| dc.date.accessioned | 
2016-12-14T15:27:48Z | 
 | 
| dc.date.available | 
2016-12-14T15:27:48Z | 
 | 
| dc.date.issued | 
2016 | 
 | 
| dc.identifier.issn | 
1543-186X | 
 | 
| dc.identifier.uri | 
http://hdl.handle.net/10900/73727 | 
 | 
| dc.language.iso | 
en | 
de_DE | 
| dc.publisher | 
Springer | 
de_DE | 
| dc.relation.uri | 
http://dx.doi.org/10.1007/s11664-016-4459-8 | 
de_DE | 
| dc.rights | 
info:eu-repo/semantics/closedAccess | 
 | 
| dc.subject.ddc | 
530 | 
de_DE | 
| dc.subject.ddc | 
600 | 
de_DE | 
| dc.title | 
Front Side Metallization of n- and p-Type, High-Efficiency, Single-Crystalline Si Solar Cells: Assessing the Temperature-Dependent Series Resistance | 
de_DE | 
| dc.type | 
Article | 
de_DE | 
| utue.quellen.id | 
20160915142648_00675 | 
 | 
| utue.publikation.seiten | 
2656-2661 | 
de_DE | 
| utue.personen.roh | 
Willsch, Benjamin | 
 | 
| utue.personen.roh | 
Kumar, Praveen | 
 | 
| utue.personen.roh | 
Eibl, Oliver | 
 | 
| dcterms.isPartOf.ZSTitelID | 
Journal of Electronic Materials | 
de_DE | 
| dcterms.isPartOf.ZS-Issue | 
6 | 
de_DE | 
| dcterms.isPartOf.ZS-Volume | 
45 | 
de_DE | 
| utue.fakultaet | 
07 Mathematisch-Naturwissenschaftliche Fakultät | 
de_DE |